ACM SIGDA and IEEE CEDA are pleased to announce that the 2026 ACM/IEEE A. Richard Newton Technical Impact Award in Electronic Design Automation was presented at DAC 2026 to Xiangyu Dong (Waymo), Xiaoxia Wu (Together AI), Guangyu Sun (Peking University), Yuan Xie (HKUST), Hai Li (Duke University), and Yiran Chen (Duke University).

They were honored for their paper:

X. Dong, X. Wu, G. Sun, Y. Xie, H. Li, Y. Chen, “Circuit and Microarchitecture Evaluation of 3D Stacking Magnetic RAM (MRAM) as a Universal Memory Replacement,” Proceedings of the Design Automation Conference (DAC), pp. 554–559, 2008.

The award recognizes an outstanding technical contribution in EDA that has had a lasting impact on the field.

Congratulations to all the authors!

More about the award: https://www.sigda.org/acm-ieee-a-richard-newton-technical-impact-award-in-eda/