Who’s Hussam Amrouch
December 1st, 2021
University of Stuttgart, Germany
Beyond-CMOS, Beyond von-Neumann Architectures, Neuromorphic Computing, Semiconductor Physics, Machine Learing for CAD
Hussam Amrouch is a Jun.-Professor heading the Chair of Semiconductor Test and Reliability (STAR) in the Computer Science, Electrical Engineering Faculty at the University of Stuttgart, Germany as well as he is a Research Group Leader at the Karlsruhe Institute of Technology (KIT), Germany. He earned in 06.2015 his Ph.D. degree in Computer Science (Dr.-Ing.) from KIT with the highest distinction (summa cum laude), which has an acceptance ratio of less than 10% at KIT. After which he had founded the “Dependable Hardware” research group at KIT, which he is still leading until now. In 07.2020, He was appointed at the University of Stuttgart, computer science department, as a Junior Professor leading the research efforts in the area of machine learning for CAD with a special focus on design for testing and reliability for advanced and emerging nanotechnologies.
Prof. Amrouch has published more than 140 multidisciplinary publications (including 55 journals) in the major research areas across the computing stack (semiconductor physics, circuit design, computer-aided design, and computer architecture). His key research interests are focused on beyond-CMOS technologies, emerging memories, and beyond-von Neumann architectures with a special focus on In-Memory Computing, Neuromorphic Computing and AI applications. He received eight times a HiPEAC Paper Award. He also received three Best Paper Award Nominations for his work in reliability; two of them from the Design Automation Conference (DAC’17, DAC’16) and one from the Design, Automation and Test in Europe Conference (DATE’17). He has 10 tutorials and 24 invited talks (including 2 keynotes) in several top international conferences (e.g., DAC, DATE, etc.), universities and companies. He has also organized 9 special sessions in top CAD conferences. He currently serves as Review Editor at the Frontiers in Electronics and Associate Editor Integration, the VLSI Journal. He serves also as Technical Program Committee (TPC) member for many top international conferences in the computer science area like Design Automation Conference (DAC). He is also a reviewer in many top journals in different research fields starting from the system level (e.g., IEEE Transactions on Computers TC) to the circuit level (e.g., IEEE Transactions on Circuits and Systems TCAS-I) all the way down to semiconductor physics (e.g., IEEE Transactions on Electron Devices TED).